School topics and lectures

The Basics of Transmission Electron Microscopy

  • High Resolution Electron Microscopy (HREM)
    • Prof. Christos Lioutas
    Aristotle University of Thessaloniki
    Greece
  • Principles and design of the Transmission Electron Microscope (TEM)
    • Dr. Aria Andreadou
    Aristotle University of Thessaloniki
    Greece
  • Physical concepts of diffraction and electron crystallography
    • Dr. Alkyoni Mantzari
    Aristotle University of Thessaloniki
    Greece
  • Contrast and image formation in TEM
    • Dr. Andreas Delimitis
    Centre for Research and Technology Hellas
    Greece

Structural Imperfections and Applications

  • Dislocations in solids
    • Dr. Gabrielle Regula
    Aix-Marseille University
    France
  • Micro- and nano-structural study of SiC, polytypes and stacking faults
    • Dr. Maya Marinova
    University of Paris-Sud
    France
  • Application of transmission electron microscopy in solving some problems of shape memory alloys
    • Prof. Danuta Stróż
    University of Silesia
    Poland
  • Electron microscopy for high-tech materials and structures: examples of work
    • Dr. Konstantinos P. Giannakopoulos
    National Centre for Scientific Research “Demokritos”
    Greece
  • Highly performing semiconductor quantum dots, towards commercialization in optoelectronics and photovoltaics
    • Dr. Alexandros Stavrinadis
    The Institute of Photonic Sciences
    Spain

Other Techniques, New Achievements

  • Advanced Microscopy, new techniques
    • Dr. Tetsuo Oikawa
    JEOL
    Japan
  • SEM, basics and applications
    • Dr. Lori Nalbandian
    Centre for Research and Technology Hellas
    Greece
  • New techniques for nanocrystal structure determination by precession electron diffraction
    • Dr. Stavros Nicolopoulos
    NanoMEGAS
    Belgium
  • AFM, basics and applications
    • Prof. Nikos Frangis
    Aristotle University of Thessaloniki
    Greece
  • Electron spectroscopy techniques for surface chemical analysis: XPS/AES/SAM
    • Prof. Panagiotis Patsalas
    University of Ioannina
    Greece
  • XRD for structural determination of materials, basics and applications
    • Prof. Tomasz Goryczka
    University of Silesia
    Poland

Microstructural Study Using Optical Techniques

  • Basic principles of optical investigation techniques
    • Prof. Jean Camassel
    University of Montpellier 2
    France
  • Optical investigation of as-grown stacking faults in SiC samples
    • Prof. Sandrine Juillaguet
    University of Montpellier 2
    France
  • SiC surfaces, interfaces and nanostructures: atomic structure, nanochemistry, and electronic & optical properties
    • Prof. Patrick Soukiassian
    University of Paris-Sud
    France

Management and Funding

  • General introduction to European Funds
    • Cécile Le Duc
    Lyon Ingénierie Projets
    France


Apart from the lectures, participants will benefit from the hands-on laboratory training. This experimental work will be held in the Electron Microscopy Laboratory of the Department of Physics of the Aristotle University of Thessaloniki.